
Femtosecond-laser induced ablation of silicate glasses and the intrinsic dissociation energy
Author(s) -
Moritz Grehn,
Thomas Seuthe,
Michael Höfner,
N. Griga,
Christoph Theiss,
Alexandre Mermillod–Blondin,
Markus Eberstein,
Hans Joachim Eichler,
Jörn Bonse
Publication year - 2014
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.4.000689
Subject(s) - fluence , femtosecond , materials science , ablation , laser , dissociation (chemistry) , optics , irradiation , laser ablation , atomic physics , dielectric , molecular physics , optoelectronics , chemistry , physics , nuclear physics , aerospace engineering , engineering
The relation between ablation threshold fluence upon femtosecond laser pulse irradiation and the average dissociation energy density of silicate based multicomponent glass is studied. A simple model based on multiphoton absorption quantifies the absorbed energy density at the ablation threshold fluence. This energy density is compared to a calculated energy density which is necessary to decompose the glass compound into its atomic constituents. The results confirm that this energy density is a crucial intrinsic material parameter for the description of the femtosecond laser ablation threshold fluence of dielectrics