Open AccessSimple technique for determining the refractive index of phase-change materials using near-infrared reflectometry
Author(s) -
Emanuele Gemo,
Sameer Vajjala Kesava,
Carlota Ruíz de Galarreta,
Liam Trimby,
Santiago Carrillo,
Moritz Riede,
Anna Baldycheva,
A. M. Alexeev,
C. David Wright
Publication year - 2020
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.395353
Subject(s) - refractive index , reflectometry , materials science , ellipsometry , optics , fabrication , phase (matter) , optoelectronics , photonics , infrared , fabry–pérot interferometer , thin film , computer science , nanotechnology , wavelength , physics , time domain , medicine , alternative medicine , pathology , quantum mechanics , computer vision
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