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Exploring microstructural variations in highly transparent AlN/SiO2 nano multilayers
Author(s) -
Chelsea D. Appleget,
Andrea Hodge
Publication year - 2020
Publication title -
optical materials express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.389156
Subject(s) - materials science , microstructure , nanoindentation , sputter deposition , amorphous solid , transmittance , transmission electron microscopy , bilayer , sputtering , layer (electronics) , high resolution transmission electron microscopy , composite material , thin film , optoelectronics , optics , nanotechnology , crystallography , chemistry , physics , membrane , biology , genetics

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