
Characteristics of the surface microstructures in thick InGaN layers on GaN
Author(s) -
Youssef El Gmili,
G. Orsal,
Konstantinos Pantzas,
Ali Ahaitouf,
T. Moudakir,
S. Gautier,
G. Patriarche,
David Tománek,
Jean Paul Salvestrini,
A. Ougazzaden
Publication year - 2013
Publication title -
optical materials express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.925
H-Index - 66
ISSN - 2159-3930
DOI - 10.1364/ome.3.001111
Subject(s) - materials science , microstructure , optoelectronics , gallium nitride , wide bandgap semiconductor , surface (topology) , optics , nanotechnology , layer (electronics) , composite material , geometry , mathematics , physics