Open AccessMultivariate analysis of x-ray scattering using a stochastic source
Author(s) -
Sioan Zohar,
Joshua J. Turner
Publication year - 2019
Publication title -
optics letters/optics index
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.524
H-Index - 272
eISSN - 1071-2763
pISSN - 0146-9592
DOI - 10.1364/ol.44.000243
Subject(s) - optics , multivariate statistics , monochromator , scattering , detector , photon , physics , statistics , mathematics , wavelength
The normalization of scattered intensity by incident flux is a crucial step in analyzing data from stochastic x-ray free electron laser sources and is complicated by non-linearities traditionally attributed to detector saturation. Here we show that such non-linearities can also arise when the sample spectra are non-uniform within the monochromator bandwidth. A method for modeling and removing this non-linearity using multivariate regression with shot-by-shot x-ray photon energy as an independent variable is presented. This approach demonstrates the benefit of event building and will allow for a reconsideration of data which has proven challenging to normalize.