Pupil plane differential detection microscopy | Zendy

Hari P. Paudel | Zendy; Clemens Alt | Zendy; Judith Runnels | Zendy; Charles P. Lin | Zendy

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Pupil plane differential detection microscopy

Author(s) -

Hari P. Paudel,

Clemens Alt,

Judith Runnels,

Charles P. Lin

Publication year - 2018

Publication title -

optics letters

Language(s) - Uncategorized

Resource type - Journals

SCImago Journal Rank - 1.524

H-Index - 272

eISSN - 1071-2763

pISSN - 0146-9592

DOI - 10.1364/ol.43.004410

Subject(s) - optics , differential interference contrast microscopy , microscopy , interference microscopy , microscope , confocal microscopy , light sheet fluorescence microscopy , materials science , scanning confocal electron microscopy , optical sectioning , pinhole (optics) , optical microscope , confocal , ptychography , physics , diffraction , scanning electron microscope

Differential interference contrast (DIC) microscopy is a powerful technique for imaging phase objects in transparent samples but does not work with scattering samples. This Letter, to the best of our knowledge, describes a new technique for obtaining DIC-like phase-gradient images in scattering media based on differential detection of forward-scattered light, using detectors arranged in a ring configuration around the microscope objective pupil or its conjugate pupil plane. This method, called pupil plane differential detection (P2D2) microscopy, does not need polarization optics or a confocal pinhole, yet produces images that are free of speckles and interference noises. We compared the P2D2 imaging technique with reflectance confocal microscopy and demonstrated P2D2 as a simple add-on to conventional laser scanning microscopes.

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