Open AccessPupil plane differential detection microscopy
Author(s) -
Hari P. Paudel,
Clemens Alt,
Judith Runnels,
Charles P. Lin
Publication year - 2018
Publication title -
optics letters/optics index
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.524
H-Index - 272
eISSN - 1071-2763
pISSN - 0146-9592
DOI - 10.1364/ol.43.004410
Subject(s) - optics , differential interference contrast microscopy , microscopy , interference microscopy , microscope , confocal microscopy , light sheet fluorescence microscopy , materials science , scanning confocal electron microscopy , optical sectioning , pinhole (optics) , optical microscope , confocal , ptychography , physics , diffraction , scanning electron microscope
Differential interference contrast (DIC) microscopy is a powerful technique for imaging phase objects in transparent samples but does not work with scattering samples. This Letter, to the best of our knowledge, describes a new technique for obtaining DIC-like phase-gradient images in scattering media based on differential detection of forward-scattered light, using detectors arranged in a ring configuration around the microscope objective pupil or its conjugate pupil plane. This method, called pupil plane differential detection (P2D2) microscopy, does not need polarization optics or a confocal pinhole, yet produces images that are free of speckles and interference noises. We compared the P2D2 imaging technique with reflectance confocal microscopy and demonstrated P2D2 as a simple add-on to conventional laser scanning microscopes.