Open AccessComa aberrations in combined two- and three-dimensional STED nanoscopy
Author(s) -
Jacopo Antonello,
Emil B. Kromann,
Daniel Burke,
Joerg Bewersdorf,
Martin J. Booth
Publication year - 2016
Publication title -
optics letters/optics index
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.524
H-Index - 272
eISSN - 1071-2763
pISSN - 0146-9592
DOI - 10.1364/ol.41.003631
Subject(s) - sted microscopy , coma (optics) , optics , physics , stimulated emission , laser
Stimulated emission depletion (STED) microscopes, like all super-resolution methods, are sensitive to aberrations. Of particular importance are aberrations that affect the quality of the depletion focus, which requires a point of near-zero intensity surrounded by strong illumination. We present analysis, modeling, and experimental measurements that show the effects of coma aberrations on depletion patterns of two-dimensional (2D) and three-dimensional (3D) STED configurations. Specifically, we find that identical coma aberrations create focal shifts in opposite directions in 2D and 3D STED. This phenomenon could affect the precision of microscopic measurements and has ramifications for the efficacy of combined 2D/3D STED systems.