100 kHz krypton planar laser-induced fluorescence imaging
Author(s) -
Stephen W. Grib,
Paul S. Hsu,
Naibo Jiang,
Josef Felver,
Stephen A. Schumaker,
Campbell D. Carter,
Sukesh Roy
Publication year - 2020
Publication title -
optics letters
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.524
H-Index - 272
eISSN - 1071-2763
pISSN - 0146-9592
DOI - 10.1364/ol.395389
Subject(s) - krypton , nanosecond , laser , planar laser induced fluorescence , optics , materials science , femtosecond , optical parametric oscillator , planar , laser induced fluorescence , x ray laser , atomic physics , xenon , physics , laser power scaling , computer graphics (images) , computer science
Krypton planar laser-induced fluorescence (Kr PLIF) was demonstrated at a repetition rate of 100 kHz. To achieve this increased rate, a custom injection-seeded optical parametric oscillator was built to efficiently convert the 355 nm output of a high-energy, high-repetition-rate nanosecond burst-mode laser to 212.56 nm to excite Kr from the ground to the 5 p [1/2] 0 electronic state. Successful tracking of flow structures and mixture fraction was demonstrated using detection speeds 100 times greater than previously attained with a femtosecond laser source. The increase in repetition rate makes time-resolved Kr PLIF relevant for high-speed flows in particular.
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