Open AccessFluorescence imaging of submicrometric lattices of colour centres in LiF by an apertureless scanning near-field optical microscope
Author(s) -
PierreMichel Adam,
Sakina Benrezzak,
Jean-Louis Bijeon,
Pascal Royer,
S. Guy,
B. Jacquier,
P. Moretti,
Rosa Maria Montereali,
M. Piccinini,
Francesca Menchini,
Fabrizia Somma,
Christian Seassal,
Hervé Rigneault
Publication year - 2001
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.9.000353
Subject(s) - optics , materials science , near field scanning optical microscope , microscope , laser , optical microscope , scanning electron microscope , microscopy , physics
We report fluorescence imaging of colour centres in Lithium Fluoride (LiF) using an apertureless Scanning Near Field Optical Microscope (SNOM). The sample consists of periodically spaced submicrometric coloured areas F2 laser-active colour centres produced by low-energy electron beam lithography on the surface of a LiF thin film. A silicon Atomic Force Microscope (AFM) tip is used as an apertureless optical probe. AFM images show a uniform surface roughness with a RMS of 7.2 nm. The SNOM images of the red fluorescence of colour centres excited at lambda = 458 nm with an argon ion laser show that the local photon emission is unambiguously related to the coloured areas and that topographic artefacts can be excluded.