Open AccessTolerancing of polarization losses in free-space optical interconnects
Author(s) -
Frédéric Lacroix,
Michael H. Ayliffe,
Andrew G. Kirk
Publication year - 2000
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.7.000381
Subject(s) - optics , polarization (electrochemistry) , tolerance analysis , monte carlo method , free space , optical interconnect , materials science , physics , interconnection , optoelectronics , computer science , telecommunications , engineering , chemistry , statistics , mathematics , engineering drawing
A study of polarization losses in free-space optical interconnects is presented. A generic method is used for the prediction of optical power losses originating from fabrication errors in the polarization characteristics of components or light sources in free-space optical systems. The impact of polarization errors is evaluated on an individual level by a sensitivity analysis and on a system level by a Monte-Carlo analysis. The method is demonstrated by application to an optical interconnect example and validated by comparison with experimental results. The simultaneous interaction of multiple tolerance parameters (commonly known as "tolerance stackup") is shown to have a significant impact on polarization losses.