Open AccessHigh-resolution polarization-sensitive Fourier ptychography microscopy using a high numerical aperture dome illuminator
Author(s) -
Mahdieh GholamiMayani,
Kim Robert Tekseth,
Dag W. Breiby,
Jørn Klein,
Muhammad Nadeem Akram
Publication year - 2022
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.469115
Subject(s) - optics , polarizer , microscopy , materials science , polarimetry , birefringence , microscope , polarization (electrochemistry) , resolution (logic) , ptychography , near field scanning optical microscope , image resolution , numerical aperture , optical microscope , physics , diffraction , chemistry , scanning electron microscope , wavelength , artificial intelligence , computer science , scattering