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Catastrophic optical damage in 808 nm broad area laser diodes: a study of the dark line defect propagation
Author(s) -
Shabnam Dadgostar,
José Luis Pura,
Irene Mediavilla,
J. Souto,
J. Jiménez
Publication year - 2022
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.463313
Subject(s) - optics , laser , materials science , cathodoluminescence , absorption (acoustics) , diode , beam (structure) , thermal , laser diode , optoelectronics , luminescence , physics , meteorology

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