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Rapid aberration correction for diffractive X-ray optics by additive manufacturing
Author(s) -
Frank Seiboth,
Adam Kubec,
Andreas Schropp,
Sven Niese,
Peter Gawlitza,
Jan Garrevoet,
Vanessa Galbierz,
Silvio Achilles,
Svenja Patjens,
Michael Stückelberger,
Christian Dávid,
Christian G. Schroer
Publication year - 2022
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.454863
Subject(s) - optics , strehl ratio , x ray optics , diffraction , chromatic aberration , physics , optical aberration , metrology , diffraction efficiency , synchrotron radiation , numerical aperture , aperture (computer memory) , wavefront , wavelength , x ray , chromatic scale , acoustics

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