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High-resolution 3D shape measurement with extended depth of field using fast chromatic focus stacking
Author(s) -
Roland Ramm,
Mohsen Mozaffari-Afshar,
Daniel Höhne,
Thomas Hilbert,
Henri Speck,
Siemen Kühl,
Daniela Hoffmann,
Sebastian Erbes,
Peter Kuehmstedt,
Stefan Heist,
Gunther Notni
Publication year - 2022
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.454856
Subject(s) - stacking , optics , focus (optics) , chromatic scale , chromatic aberration , physics , wavelength , depth of field , depth of focus (tectonics) , materials science , geology , nuclear magnetic resonance , tectonics , paleontology , subduction

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