Quantitative detection of defect size based on infrared thermography: temperature integral method

Quantitative detection of the defect size by infrared thermography is difficult. In this paper, a novel temperature integral method (TIM) is introduced for the quantitative detection of the defect size. The TIM integrates the temperature values of each pixel across the defect area to obtain the defect sizes quantitatively and conveniently. The performance of the TIM on the defect size detection is evaluated thoroughly with both experiments and simulations. Furthermore, the TIM method was compared with existing methods for quantitative detection of defect size. The results indicate robustness and accuracy of TIM.