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High-resolution dark-field confocal microscopy based on radially polarized illumination
Author(s) -
Zijie Hua,
Jian Liu,
Chenguang Liu
Publication year - 2022
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.451507
Subject(s) - optics , materials science , dark field microscopy , microscopy , image resolution , resolution (logic) , confocal microscopy , confocal , diffraction , point spread function , near field scanning optical microscope , optical microscope , physics , scanning electron microscope , artificial intelligence , computer science

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