
Fourier ptychographic dark field x-ray microscopy
Author(s) -
Mads Carlsen,
Trygve Magnus Ræder,
Can Yildirim,
Raquel Rodríguez-Lamas,
C. Detlefs,
Hugh Simons
Publication year - 2022
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.447657
Subject(s) - optics , ptychography , microscopy , fourier transform , materials science , characterization (materials science) , diffraction , phase retrieval , dark field microscopy , lens (geology) , physics , quantum mechanics