Open AccessOptical characterization of inhomogeneous thin films with randomly rough boundaries
Author(s) -
Jiří Vohánka,
Ivan Ohlı́dal,
Vilma Buršı̂ková,
Petr Klapetek,
Nupinderjeet Kaur
Publication year - 2022
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.447146
Subject(s) - materials science , thin film , reflectometry , optics , ellipsometry , surface roughness , surface finish , chemical vapor deposition , substrate (aquarium) , characterization (materials science) , grain boundary , composite material , optoelectronics , nanotechnology , microstructure , physics , time domain , oceanography , geology , computer science , computer vision