Open AccessCircular polarization analyzer based on surface plasmon polariton interference
Author(s) -
Peizhen Qiu,
Chunli Bai,
Yuan Mao,
Dawei Zhang
Publication year - 2021
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.442630
Subject(s) - optics , surface plasmon polariton , polarization (electrochemistry) , circular polarization , chirality (physics) , interference (communication) , surface plasmon , wavelength , spectrum analyzer , materials science , near and far field , polariton , plasmon , physics , telecommunications , chemistry , channel (broadcasting) , chiral symmetry breaking , quantum mechanics , computer science , nambu–jona lasinio model , quark , microstrip
The determination of chirality of circularly polarized light (CPL) is of great significance to the development of various optical techniques. In this paper, a miniature circular polarization analyzer (CPA) based on surface plasmon polariton (SPP) interference is proposed. The proposed CPA consists of a micron scale long sub-wavelength slit and two groups of spatially arranged periodic sub-wavelength rectangular groove pairs, which are etched in a metal layer. Under the illumination of a CPL with a given chirality, the proposed CPA is capable of forming SPP-mediated interference fringes with different periods in far field. The chirality of CPL can be directly and quantitatively differentiated by the frequency value of the far field SPP-mediated interference fringes. Different from the existing SPP-based CPAs, the proposed CPA can directly image the chirality information in far field, avoiding near-field imaging of the SPP field.