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Range-precision improvement of a time-of-flight range sensor using dual reference plane sampling
Author(s) -
Tatsuki Furuhashi,
Keita Yasutomi,
Ryosuke Hatada,
Mitsuru Tamaya,
Keiichiro Kagawa,
Shoji Kawahito
Publication year - 2021
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.441219
Subject(s) - optics , jitter , range (aeronautics) , accuracy and precision , sampling (signal processing) , physics , materials science , computer science , detector , telecommunications , quantum mechanics , composite material
This study aimed to achieve high range precision in the sub-100 µm order with time-of-flight (TOF) range imaging for 3-D scanners. The precision of a TOF range imager was improved using dual reference plane sampling (DRPS). DRPS using two short-pulse lasers reduces driver jitter, which limits the range precision below sub-100 µm. A proof-of-concept measurement system implemented using a TOF range imager demonstrated the reduction in driver jitters, resulting in reduced column-to-column variation in range precision. The developed system also achieved a high precision of 52 µm using a single frame and 27 µm using a 10-frame average.

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