Range-precision improvement of a time-of-flight range sensor using dual reference plane sampling

This study aimed to achieve high range precision in the sub-100 µm order with time-of-flight (TOF) range imaging for 3-D scanners. The precision of a TOF range imager was improved using dual reference plane sampling (DRPS). DRPS using two short-pulse lasers reduces driver jitter, which limits the range precision below sub-100 µm. A proof-of-concept measurement system implemented using a TOF range imager demonstrated the reduction in driver jitters, resulting in reduced column-to-column variation in range precision. The developed system also achieved a high precision of 52 µm using a single frame and 27 µm using a 10-frame average.