Enhancement of image sharpness and height measurement using a low-speckle light source based on a patterned quantum dot film in dual-wavelength digital holography | Zendy

Se Hwan Jang | Zendy; Ki Baek Kim | Zendy; Juwon Jung | Zendy; YoungJoo Kim | Zendy

Open Access

Enhancement of image sharpness and height measurement using a low-speckle light source based on a patterned quantum dot film in dual-wavelength digital holography

Author(s) -

Se Hwan Jang,

Ki Baek Kim,

Juwon Jung,

YoungJoo Kim

Publication year - 2021

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.440158

Subject(s) - optics , holography , wavelength , speckle pattern , materials science , quantum dot , speckle noise , optoelectronics , digital holography , physics

A dual-wavelength single light source based on a patterned quantum dot (QD) film was developed with a 405nm LED and bandpass filters to increase color conversion efficiency as well as to decouple the two peaks of dual-wavelength emitted from the QD film. A QD film was patterned laterally with two different sizes of QDs and was combined with bandpass filters to produce a high efficiency and low-speckle dual-wavelength light source. The experimental results showed that the developed dual-wavelength light source can decrease speckle noise to improve the reconstructed image sharpness and the accuracy on height measurement in dual-wavelength digital holography.

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