Open AccessProbing mid-infrared surface interface states based on thermal emission
Author(s) -
Fan Zhong,
Ye Zhang,
Shining Zhu,
Hui Liu
Publication year - 2021
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.439729
Subject(s) - infrared , materials science , optics , waveguide , surface wave , surface plasmon , optoelectronics , terahertz radiation , dispersion (optics) , thermal , interface (matter) , thermal infrared spectroscopy , thermal radiation , plasmon , physics , meteorology , thermodynamics , capillary number , capillary action , composite material
Probing mid-infrared surface wave radiation remains a big challenge for a long time. The lack of convenient and quick mid-infrared surface wave radiation probing methods limits the development of the integrated mid-infrared materials and devices. In this work, we propose a scheme to construct and probe the mid-infrared surface wave radiation of interface state in the waveguide through thermal emission. A superlattice composed of alternately placed periodic meta-crystals is designed to construct an array of interfaces to realize the interface states through the transverse electrical waveguide modes with a tolerance in structural parameters. By heating the structure, we employ angular resolved thermal emission spectroscopy to directly and quickly verify the dispersion of mid-infrared interface states, which have specific frequencies, angles, and polarizations. Moreover, we establish a thermal imaging microscopy to probe the local waveguide interface state directly for the first time. This proposed infrared probing method based on thermal emission can be generalized to probe the mid-infrared surface wave in other systems, such as surface plasmon waves in graphene or surface phonon waves in two-dimensional materials in the mid-infrared range.