Open AccessLow-loss broadband bi-layer edge couplers for visible light
Author(s) -
Yiding Lin,
Jason C. C. Mak,
Hong Chen,
Xin Mu,
Andrei Stalmashonak,
Young-Ho Jung,
Xianshu Luo,
Patrick Lo,
Wesley D. Sacher,
Joyce K. S. Poon
Publication year - 2021
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.435669
Subject(s) - coupling loss , materials science , optics , waveguide , optoelectronics , lithography , photonic integrated circuit , broadband , insertion loss , photonics , coupling (piping) , optical fiber , physics , metallurgy
Low-loss broadband fiber-to-chip coupling is currently challenging for visible-light photonic-integrated circuits (PICs) that need both high confinement waveguides for high-density integration and a minimum feature size above foundry lithographical limit. Here, we demonstrate bi-layer silicon nitride (SiN) edge couplers that have ≤ 4 dB/facet coupling loss with the Nufern S405-XP fiber over a broad optical wavelength range from 445 to 640 nm. The design uses a thin layer of SiN to expand the mode at the facet and adiabatically transfers the input light into a high-confinement single-mode waveguide (150-nm thick) for routing, while keeping the minimum nominal lithographic feature size at 150 nm. The achieved fiber-to-chip coupling loss is about 3 to 5 dB lower than that of single-layer designs with the same waveguide confinement and minimum feature size limitation.