
Phase-sensitive detection of gas-borne Si nanoparticles via line-of-sight UV/VIS attenuation
Author(s) -
Muhammad Asif,
Jan Menser,
Torsten Endres,
Thomas Dreier,
Kyle J. Daun,
Christof Schulz
Publication year - 2021
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.426528
Subject(s) - materials science , attenuation , nanoparticle , optics , microwave , plasma , mie scattering , phase (matter) , analytical chemistry (journal) , scattering , light scattering , nanotechnology , chemistry , chromatography , physics , organic chemistry , quantum mechanics
The distinct optical properties of solid and liquid silicon nanoparticles are exploited to determine the distribution of gas-borne solid and liquid particles in situ using line-of-sight attenuation measurements carried out across a microwave plasma reactor operated at 100 mbar. The ratio between liquid and solid particles detected downstream of the plasma varied with measurement location, microwave power, and flow rate. Temperatures of the liquid particles were pyrometrically-inferred using a spectroscopic model based on Drude theory. The phase-sensitive measurement supports the understanding of nanoparticle formation and interaction and thus the overall gas-phase synthesis process.