Open AccessClosed-form approximation of symmetric thin-film multi-layer plasmonic dispersion equation solutions
Author(s) -
Yousef Alattar,
G. Kember,
Michael Čada
Publication year - 2021
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.415870
Subject(s) - cladding (metalworking) , plasmon , optics , dielectric , dispersion relation , materials science , attenuation , thin film , insulator (electricity) , surface plasmon , wavelength , attenuation coefficient , physics , condensed matter physics , optoelectronics , nanotechnology , composite material
An original asymptotic method is developed and used to find closed-form approximations to the symmetric thin-film three- and multi-layer plasmonic dispersion equations. Closed-form analysis of three-layer metal-insulator-metal (MIM: "M" is metal and "I" is insulator) and IMI devices shows a complementary physics underpinning their properties. Analysis of multi-layer symmetric devices, considered for a seven-layer MIMIMIM example, uncovers a remarkable departure from the physics governing MIM and IMI features. Multi-layer propagation length and attenuation are determined by proximity, in the space of cladding thickness and wavelength, to singularities that exist in the limit of vanishing imaginary part of the cladding dielectric constant. Exploitation of this phenomenon will expand the development of a broader range of thin-film applications in optoelectronics.