Open AccessHigh-throughput terahertz spectral line imaging using an echelon mirror
Author(s) -
Gaku Asai,
Daiki Hata,
Shintaro Harada,
Tatsuki Kasai,
Yusuke Arashida,
Ikufumi Katayama
Publication year - 2021
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.413802
Subject(s) - terahertz radiation , optics , terahertz spectroscopy and technology , spectral imaging , broadband , materials science , image resolution , bandwidth (computing) , physics , optoelectronics , computer science , telecommunications
This work demonstrates terahertz (THz) line imaging that acquires broadband spectral information by combining echelon-based single-shot THz spectroscopy with high-sensitivity phase-offset electrooptic detection. An approximately 40 dB signal-to-noise ratio is obtained for a THz spectrum from a single line of the camera, with a detection bandwidth up to 2 THz at the peak electric-field strength of 1.2 kV/cm. The spatial resolution of the image is confirmed to be diffraction limited for each spectral component of the THz wave. We use the system to image sugar tablets by quickly scanning the sample, which illustrates the capacity of the proposed spectral line imaging system for high-throughput applications.