Open AccessAngular invariance of the contribution of an anisotropic thin surface layer to reflectance and reflectance-absorbance
Author(s) -
Alexander V. Michailov,
Alexey V. Povolotskiy,
V. L. Kuzmin
Publication year - 2021
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.413642
Subject(s) - absorbance , optics , materials science , total internal reflection , anisotropy , angle of incidence (optics) , reflection (computer programming) , spectroscopy , plane of incidence , radiation , transmittance , thin film , near infrared spectroscopy , spectral line , physics , plane wave , quantum mechanics , astronomy , computer science , programming language , nanotechnology
The absorbance studies of the optical radiation reflection from the boundary of two soft-matter media with a thin monolayer between are performed for a number of angles of incidence. The reflectance and absorbance spectra are described in terms of a unique spectrum invariant with respect to the incidence angles. The angular dependence of the absorbance for s-polarized radiation is shown to not provide any extra information as compared with a single-angle study in line with the previously developed theoretical considerations. We verify it experimentally performing the multi-angle infrared reflection-absorption spectroscopy measurements at the air-water interface with a thin lipid film.