Open AccessEnhanced multifocal structured illumination microscopy with desired optical sectioning capability and lateral resolution improvement
Author(s) -
Chenshuang Zhang,
Wei Zhang,
Bin Yu,
Dongxin Lin,
Junle Qu
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.412489
Subject(s) - optical sectioning , optics , microscopy , materials science , resolution (logic) , optical microscope , image resolution , image processing , computer science , image (mathematics) , artificial intelligence , physics , scanning electron microscope
Multifocal structured illumination microscopy (MSIM) can rapidly retrieve 3D structures of thick samples by using multi-spot excitation and detection. Although numerous super-resolution (SR) and optical sectioning (OS) methods have been introduced in this field, the existing OS-SR method in MSIM still has the difficulty in rejecting deep defocused light, which may lead to strong background signal in the retrieved results. To this end, an enhanced OS-SR method is proposed to simultaneously achieve the desired OS capability and significant resolution improvement in MSIM. The enhanced OS-SR image is obtained by combining the standard deviation image with the conventional OS-SR image in the frequency domain. The validity of the proposed method is demonstrated by simulation and experimental results.