Open AccessSimultaneous optical coherence tomography and Scheimpflug imaging using the same incident light
Author(s) -
Xiaoran Li,
Samuel Lawman,
Bryan Williams,
Sicong Ye,
Yaochun Shen,
Yalin Zheng
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.405643
Subject(s) - scheimpflug principle , optics , optical coherence tomography , raster scan , image resolution , resolution (logic) , materials science , tomography , lens (geology) , scanner , tomographic reconstruction , refractive index , physics , cornea , computer science , artificial intelligence
For any single anterior chamber cross-sectional (tomographic) imaging method, there is a practical compromise between image size and image resolution. In order to obtain large field-of-view cross-sectional images of the whole anterior chamber and high-resolution cross-sectional images of the fine corneal layers, measurements by multiple devices are currently required. This paper presents a novel raster scanning tomographic imaging device that acquires simultaneous large field-of-view Scheimpflug (12.5 mm image depth, 50 μm axial resolution in air) and high-resolution spectral domain optical coherence tomography (SD-OCT) (2 mm image depth, 3.7μm axial resolution in air) using the same illuminating photons. For the novel raster scanning 3D Scheimpflug imaging, a tunable lens system together with numerical methods for correcting refraction distortion were used. To demonstrate the capability of simultaneous measurement of both fine corneal layers and whole anterior chambers topology, ex vivo measurements on 12 porcine and 12 bovine eyes were carried out. There is a reasonable agreement in the overall central corneal thicknesses (CCT) obtained from the simultaneous SD-OCT and Scheimpflug measurements. In addition, because the same infrared light beam was used to illuminate the sample, both OCT and Scheimpflug images were taken at the exact same location of a sample simultaneously in a single measurement. This provides a unique method for measuring both the thickness and the refractive index of a sample.