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Gamma radiation effects on passive silicon photonic waveguides using phase sensitive methods
Author(s) -
Nicholas Boynton,
Michael Gehl,
Christina Dallo,
Andrew Pomerene,
Andrew Starbuck,
Dana Hood,
P.E. Dodd,
Scot E. Swanson,
Douglas C. Trotter,
Christopher T. DeRose,
Anthony L. Lentine
Publication year - 2020
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.401299
Subject(s) - optics , waveguide , photonics , refractive index , photonic integrated circuit , silicon , materials science , wavelength , interferometry , radiation , optoelectronics , silicon photonics , phase (matter) , physics , quantum mechanics
Passive silicon photonic waveguides are exposed to gamma radiation to understand how the performance of silicon photonic integrated circuits is affected in harsh environments such as space or high energy physics experiments. The propagation loss and group index of the mode guided by these waveguides is characterized by implementing a phase sensitive swept-wavelength interferometric method. We find that the propagation loss associated with each waveguide geometry explored in this study slightly increases at absorbed doses of up to 100 krad (Si). The measured change in group index associated with the same waveguide geometries is negligibly changed after exposure. Additionally, we show that the post-exposure degradation of these waveguides can be improved through heat treatment.

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