Terahertz probing of sunflower leaf multilayer organization
Author(s) -
Yannick Abautret,
Dominique Coquillat,
Myriam Zerrad,
Xavier Buet,
Ryad Bendoula,
Gabriel Soriano,
Nicolas Brouilly,
Daphné Héran,
Bruno Grèzes-Besset,
Frédéric Chazallet,
Claude Amra
Publication year - 2020
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.400852
Subject(s) - terahertz radiation , optics , materials science , fabry–pérot interferometer , stack (abstract data type) , terahertz spectroscopy and technology , fourier transform , sunflower , microscopy , thin film , characterization (materials science) , optoelectronics , physics , computer science , wavelength , nanotechnology , mathematics , quantum mechanics , programming language , combinatorics
We analyze the multilayer structure of sunflower leaves from Terahertz data measured in the time-domain at a ps scale. Thin film reverse engineering techniques are applied to the Fourier amplitude of the reflected and transmitted signals in the frequency range f < 1.5 Terahertz (THz). Validation is first performed with success on etalon samples. The optimal structure of the leaf is found to be a 8-layer stack, in good agreement with microscopy investigations. Results may open the door to a complementary classification of leaves.
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