Open AccessModeling of an X-ray grating-based imaging interferometer using ray tracing
Author(s) -
Jeffrey P. Wilde,
Lambertus Hesselink
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.400640
Subject(s) - ray tracing (physics) , optics , visibility , interferometry , grating , astronomical interferometer , zemax , computer science , attenuation , phase contrast imaging , projection (relational algebra) , physics , software , algorithm , phase contrast microscopy , programming language
X-ray imaging by means of a grating-based Talbot-Lau interferometer has become an important tool for a wide variety of application areas such as security, medical and materials analysis. Imaging modalities include attenuation, differential phase contrast, and visibility contrast (or so-called dark field). We have developed a novel modeling approach based on ray tracing with commercially available software (Zemax OpticStudio) that yields image projections for all three modalities. The results compare favorably with experimental findings. Our polychromatic ray-based model accommodates realistic 3-D CAD objects with tailored materials properties and also allows for both surface and bulk scattering. As such, the model can simulate imaging of complicated objects as well as assist in a physical understanding of experimental projection details.