Open AccessExtended depth of field and aberration control for inexpensive digital microscope systems
Author(s) -
S. C. Tucker,
W. Thomas Cathey,
Edward R. Dowski
Publication year - 1999
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.4.000467
Subject(s) - optics , depth of field , chromatic aberration , microscope , wavefront , microscopy , field (mathematics) , phase (matter) , materials science , physics , chromatic scale , mathematics , quantum mechanics , pure mathematics
We present a new application and current results for extending depth of field using wave front coding. A cubic phase plate is used to code wave fronts in microscopy resulting in extended depths of field and inexpensive chromatic aberration control. A review of the theory behind cubic phase plate extended depth of field systems is given along with the challenges that are face when applying the theory to microscopy. Current results from the new extended depth of field microscope systems are shown.