Open AccessA compact and polarization-insensitive silicon waveguide crossing based on subwavelength grating MMI couplers
Author(s) -
Shoujun Wu,
Simei Mao,
Lidan Zhou,
Lin Liu,
Yujie Chen,
Xin Mu,
Lirong Cheng,
Zhenmin Chen,
Xiaoguang Tu,
H. Y. Fu
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.399568
Subject(s) - optics , grating , silicon on insulator , materials science , polarization (electrochemistry) , waveguide , insertion loss , silicon , optoelectronics , refractive index , physics , chemistry
In this work, we proposed and experimentally demonstrated a compact and low polarization-dependent silicon waveguide crossing based on subwavelength grating multimode interference couplers. The subwavelength grating structure decreases the effective refractive index difference and shrinks the device footprint. Our designed device is fabricated on the 220-nm SOI platform and performs well. The measured crossing is characterized with low insertion loss (< 1 dB), low polarization-dependence loss (< 0.6 dB), and low crosstalk (< -35 dB) for both TE and TM polarizations with a compact footprint of 12.5 μm × 12.5 μm.