
Parametric effects by using the strip-pair comparison method around red CIE color center
Author(s) -
Fernando Brusola,
Ignacio Tortajada,
Ismael Lengua Lengua,
Begoña Jordá,
Guillermo Perís-Fajarnés
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.395291
Subject(s) - chromaticity , optics , ellipse , color difference , parametric statistics , monochromatic color , physics , mathematics , geometry , computer science , artificial intelligence , statistics , enhanced data rates for gsm evolution
The strip comparison method, based on the serial exploration method described by Torgerson [Theory and Methods of Scaling; Wiley & Sons (1958); Chap. 7], for the development of near-threshold color difference models was presented and validated with theoretical data by the authors in a previous work. In this study, we investigate parametric effects derived from the use of the strip comparison method on chromaticity-discrimination ellipses around the red CIE color center. The results obtained led to the conclusion that the strip comparison method has little effect on the parameters of the chromaticity-discrimination ellipses determined by the pair comparison method when pairs of patches in the strips are separated by a black line 0.5 mm thick or are separated by 3 mm spacing on a white background and also correlates well with the parameters reported by other authors using the pair comparison method at the threshold.