Open AccessEnhanced reconstruction of structured illumination microscopy on a polarized specimen
Author(s) -
Xingye Chen,
Karl Zhanghao,
Meiqi Li,
Chang Qiao,
Wenhui Liu,
Peng Xi,
Qionghai Dai
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.395092
Subject(s) - optics , polarization (electrochemistry) , microscopy , isotropy , dipole , physics , materials science , circular polarization , chemistry , quantum mechanics , microstrip
Structured illumination microscopy (SIM) requires polarization control to guarantee the high-contrast illumination pattern. However, this modulated polarization will induce artifacts in SIM when imaging fluorescent dipoles. Here we proposed the polarization weighted recombination of frequency components to reconstruct SIM data with suppressed artifacts and better resolving power. Both the simulation results and experimental data demonstrate that our algorithm can obtain isotropic resolution on dipoles and resolve a clearer structure in high-density sections compared to the conventional algorithm. Our work reinforces the SIM theory and paves the avenue for the application of SIM on a polarized specimen.