Open AccessMeasurement of complex refractive index with tunable extreme ultraviolet high harmonic source
Author(s) -
Daisuke Hirano,
Yuki Nagakubo,
Junko Omachi,
Kosuke Yoshioka,
Makoto KuwataGonokami
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.392272
Subject(s) - optics , refractive index , extreme ultraviolet , materials science , x ray optics , harmonic , broadband , photon counting , ultraviolet , interference (communication) , range (aeronautics) , neon , laser , optoelectronics , physics , photon , argon , telecommunications , channel (broadcasting) , quantum mechanics , x ray , composite material , atomic physics , computer science
We report a broadband refractive index measurement method based on a higher harmonic generation tabletop coherent extreme ultraviolet source. We measured the complex refractive index of a sample material by measuring the interference pattern produced by a bare double slit and comparing this with the pattern produced by another double slit with one slit covered by the sample material. We validated the method by measuring the complex refractive index of aluminum in the photon energy range of 63-78 eV using a neon gas jet. The measurement system had errors of less than 0.02%.