z-logo
open-access-imgOpen Access
Ultra-compact and efficient 1 × 2 mode converters based on rotatable direct-binary-search algorithm
Author(s) -
Hansi Ma,
Jie Huang,
Kaiwang Zhang,
Junbo Yang
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.392145
Subject(s) - materials science , optics , fabrication , insertion loss , binary number , converters , reflection loss , optoelectronics , algorithm , computer science , physics , power (physics) , medicine , alternative medicine , pathology , quantum mechanics , composite number , arithmetic , mathematics
In this paper, we innovatively demonstrate a rotatable direct-binary-search algorithm. Based on this unique inverse design method, the coupling region of nanophotonic device can be realized with multi-shape and multi-rotation pixels. In addition, the novel 1× 2 mode converters with multipurpose design goals on a 220 nm-thick top silicon-on-insulator platform are proposed by utilizing this enhanced algorithm, which can simultaneously achieve power splitting and mode conversion. By 3D fine difference time domain solutions, the 1 × 2 mode converter that converts TE 0 mode into TE 1 , with a footprint of 2.7 µm × 2.4 µm, exhibits the excess loss of 0.1 - 0.2 dB (TE 1 mode), crosstalk of lower than -20.6 dB (TE 0 mode) and reflection loss of lower than -19.5 dB (TE 0 mode) from 1500 nm to 1600 nm. The 1 × 2 mode converter that transforms TE 0 into TE 2 occupies the footprint of 3.6 µm × 3 µm. The excess loss is 0.3 - 0.4 dB (TE 2 mode) in the wavelength range of 1500 - 1600 nm. The crosstalks are lower than -17.5 dB (TE 1 mode) and -25.1 dB (TE 0 mode), and the reflection loss is lower than -18.3 dB (TE 0 mode). Besides, the fabrication tolerances caused by both expansion or contraction of etched pattern contour and round corner effect are also investigated.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here