Open AccessOptimized approach for optical sectioning enhancement in multifocal structured illumination microscopy
Author(s) -
Wei Zhang,
Bin Yu,
Danying Lin,
Hua Yu,
Siwei Li,
Junle Qu
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.390831
Subject(s) - optical sectioning , optics , focus (optics) , microscopy , materials science , optical microscope , diffraction , depth of focus (tectonics) , light sheet fluorescence microscopy , resolution (logic) , computer science , scanning confocal electron microscopy , scanning electron microscope , artificial intelligence , physics , paleontology , subduction , biology , tectonics
Multifocal structured illumination microscopy (MSIM) is the parallelized version of image scanning microscopy (ISM) that is created by using many excitation spots, which provides a two-fold resolution enhancement beyond the diffraction limit with a frequency of 1 Hz per 3D picture, but scattered and out-of-focus light in thick samples degrades MSIM optical sectioning performance. Herein, we introduce a new optical sectioning method in MSIM via illumination fluctuation. The proposed method suppresses the out-of-focus light by taking full advantage of the statistic property of MSIM raw data and has no requirement of changing the system setup or projecting more illumination patterns. Experimental results demonstrate that the method can reduce the out-of-focus light by 7.25 times in optical sectioning image.