Open AccessX-ray phase-sensitive imaging using a bilens interferometer based on refractive optics
Author(s) -
Dmitrii Zverev,
I. Snigireva,
V. G. Kohn,
С. П. Кузнецов,
V. Yunkin,
A. Snigirev
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.389940
Subject(s) - optics , interferometry , interference (communication) , astronomical interferometer , phase contrast imaging , phase (matter) , beamline , lens (geology) , detector , x ray optics , physics , image resolution , spatial frequency , resolution (logic) , interference microscopy , sample (material) , phase retrieval , refractive index , beam (structure) , x ray , computer science , fourier transform , computer network , channel (broadcasting) , quantum mechanics , artificial intelligence , thermodynamics , phase contrast microscopy
The phase-sensitive X-ray imaging technique based on the bilens interferometer is developed. The essence of the method consists of scanning a sample, which is set upstream of the bilens across the beam of one lens of the interferometer by recording changes in the interference pattern using a high-resolution image detector. The proposed approach allows acquiring the absolute value of a phase shift profile of the sample with a fairly high phase and spatial resolution. The possibilities of the imaging technique were studied theoretically and experimentally using fibres with different sizes as the test samples at the ESRF ID06 beamline with 12 keV X-rays. The corresponding phase shift profile reconstructions and computer simulations were performed. The experimental results are fully consistent with theoretical concepts and appropriate numerical calculations. Applications of the interferometric imaging technique are discussed, as well as future improvements.