Ultra-narrow-linewidth measurement utilizing dual-parameter acquisition through a partially coherent light interference | Zendy

Zhihui Wang | Zendy; Changjian Ke | Zendy; Yibo Zhong | Zendy; Xing Chen | Zendy; Haoyu Wang | Zendy; Keyuan Yang | Zendy; Sheng Cui | Zendy; Deming Liu | Zendy

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Ultra-narrow-linewidth measurement utilizing dual-parameter acquisition through a partially coherent light interference

Author(s) -

Zhihui Wang,

Changjian Ke,

Yibo Zhong,

Xing Chen,

Haoyu Wang,

Keyuan Yang,

Sheng Cui,

Deming Liu

Publication year - 2020

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.387398

Subject(s) - laser linewidth , optics , interference (communication) , measure (data warehouse) , spectral density , noise (video) , laser , power (physics) , physics , computer science , telecommunications , channel (broadcasting) , quantum mechanics , database , artificial intelligence , image (mathematics)

Laser linewidths of the order of 100 Hz are challenging to measure with existing technology. We propose a simple, efficient method to measure ultra-narrow linewidths using dual-parameter acquisition based on partially coherent light interference. The linewidth is obtained using two parameters that are easily extracted from the power spectrum. This method reduces the influence of 1/f noise by utilizing a kilometer-order-length delay fiber and is independent of the fiber-length error for a general situation. Simulation results show that, for a length error less than 10%, the total linewidth measurement error is less than 0.3%. Experimental results confirm the feasibility and superior performance of this method.

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