Open AccessContrast gain through simple illumination control for wide-field fluorescence imaging of scattering samples
Author(s) -
Zongyue Cheng,
Shi-Hai Sun,
WenBiao Gan,
Meng Cui
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.385319
Subject(s) - optics , scattering , fluorescence lifetime imaging microscopy , materials science , microscopy , contrast (vision) , light sheet fluorescence microscopy , confocal , fluorescence , confocal microscopy , signal (programming language) , physics , scanning confocal electron microscopy , computer science , programming language
Wide field fluorescence microscopy is the most commonly employed fluorescence imaging modality. However, a major drawback of wide field imaging is the very limited imaging depth in scattering samples. By experimentally varying the control of illumination, we found that the optimized illumination profile can lead to large contrast improvement for imaging at a depth beyond four scattering path lengths. At such imaging depth, we found that the achieved image signal-to-noise ratio can rival that of confocal measurement. As the employed illumination control is very simple, the method can be broadly applied to a wide variety of wide field fluorescence imaging systems.