Measuring laser beam quality, wavefronts, and lens aberrations using ptychography | Zendy

Mengqi Du | Zendy; Lars Loetgering | Zendy; K. S. E. Eikema | Zendy; Stefan Witte | Zendy

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Measuring laser beam quality, wavefronts, and lens aberrations using ptychography

Author(s) -

Mengqi Du,

Lars Loetgering,

K. S. E. Eikema,

Stefan Witte

Publication year - 2020

Publication title -

optics express

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.394

H-Index - 271

ISSN - 1094-4087

DOI - 10.1364/oe.385191

Subject(s) - optics , ptychography , wavefront , supercontinuum , microlens , lens (geology) , achromatic lens , laser , physics , wavefront sensor , laser beam quality , metrology , laser beams , diffraction , optical fiber , photonic crystal fiber

We report on an approach for quantitative characterization of laser beam quality, wavefronts, and lens aberrations using ptychography with a near-infrared supercontinuum laser. Ptychography is shown to offer a powerful alternative for both beam propagation ratio M 2 and wavefront measurements compared with existing techniques. In addition, ptychography is used to recover the transmission function of a microlens array for aberration analysis. The results demonstrate ptychography's flexibility in wavefront metrology and optical shop testing.

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