
Measuring laser beam quality, wavefronts, and lens aberrations using ptychography
Author(s) -
Mengqi Du,
Lars Loetgering,
K.S.E. Eikema,
Stefan Witte
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.385191
Subject(s) - optics , ptychography , wavefront , supercontinuum , microlens , lens (geology) , achromatic lens , laser , physics , wavefront sensor , laser beam quality , metrology , laser beams , diffraction , optical fiber , photonic crystal fiber
We report on an approach for quantitative characterization of laser beam quality, wavefronts, and lens aberrations using ptychography with a near-infrared supercontinuum laser. Ptychography is shown to offer a powerful alternative for both beam propagation ratio M 2 and wavefront measurements compared with existing techniques. In addition, ptychography is used to recover the transmission function of a microlens array for aberration analysis. The results demonstrate ptychography's flexibility in wavefront metrology and optical shop testing.