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Hand-guided qualitative deflectometry with a mobile device
Author(s) -
Florian Willomitzer,
Chia-Kai Yeh,
Vikas Gupta,
William G. Spies,
Florian Schiffers,
Aggelos K. Katsaggelos,
Marc Walton,
Oliver Cossairt
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.383475
Subject(s) - computer science , image stitching , computer vision , artificial intelligence , fiducial marker , field of view , mobile device , tracking system , calibration , specular reflection , process (computing) , computer graphics (images) , optics , physics , filter (signal processing) , operating system , quantum mechanics
We introduce a system that exploits the screen and front-facing camera of a mobile device to perform three-dimensional deflectometry-based surface measurements. In contrast to current mobile deflectometry systems, our method can capture surfaces with large normal variation and wide field of view (FoV). We achieve this by applying automated multi-view panoramic stitching algorithms to produce a large FoV normal map from a hand-guided capture process without the need for external tracking systems, like robot arms or fiducials. The presented work enables 3D surface measurements of specular objects 'in the wild' with a system accessible to users with little to no technical imaging experience. We demonstrate high-quality 3D surface measurements without the need for a calibration procedure. We provide experimental results with our prototype Deflectometry system and discuss applications for computer vision tasks such as object detection and recognition.

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