Open AccessLow-loss, low-crosstalk waveguide crossing for scalable integrated silicon photonics applications
Author(s) -
Mack Johnson,
Mark G. Thompson,
Döndü Sahin
Publication year - 2020
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.381304
Subject(s) - optics , reflectometry , waveguide , insertion loss , materials science , finite difference time domain method , silicon on insulator , crosstalk , photonics , backscatter (email) , optoelectronics , time domain , silicon , physics , telecommunications , computer science , wireless , computer vision
A waveguide crossing based on multi-mode interference is designed and experimentally characterized on the silicon platform. The insertion loss of the device is measured as 43 ± 4 mdB per crossing, with a crosstalk of < -50 dB between 1550 and 1560 nm, in good agreement with predictions from 3D finite-difference time-domain simulations. Furthermore, the device backscatter was investigated using white light reflectometry and no significant backscatter was observed from 160 waveguide crossings in the time domain. In the frequency domain, the backscatter of the waveguide crossing device was measured experimentally for the first time, achieving a backscatter of -55 dB. The crossing has a footprint of 14.3 x 14.3 µm 2 and can be fabricated in a single step.