Characterization of anisotropy of the porous anodic alumina by the Mueller matrix imaging method

Porous anodic alumina (PAA) is a photonic crystal with a hexagonal porous structure. To learn more about the effects brought by pores on the anisotropy of the PAA, we use the orientation sensitive Mueller matrix imaging (MMI) method to study it. We fabricated the PAA samples with uniform pores and two different pore diameters. By the MMI experiments with these samples, we found that the birefringence is the major anisotropy of the PAA and that there are many small areas with different orientations that formed spontaneously in the process of production on the surface of the PAA. By the MMI experiments at different orientations of the sample with two different pore diameters, we found that the pores affect the birefringence of the sample and the effect increases with the increased inclination of the sample. To further analyze the PAA, we present a symmetrical rotation measurement method according to the Mueller matrix of the retarder. With this method, we can calculate the average refractive index (RI) of birefringence and the orientation of the optical axis of uniaxial crystal. The results also show the effect of the pores on the anisotropy of PAA.