Open AccessBackside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity
Author(s) -
Refahi Abou Khachfe,
Dominique Ausserré
Publication year - 2020
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.28.004836
Subject(s) - optics , refractive index , materials science , reflectivity , microscopy , sample (material) , signal (programming language) , layer (electronics) , resolution (logic) , sensitivity (control systems) , optoelectronics , nanotechnology , physics , computer science , engineering , artificial intelligence , electronic engineering , thermodynamics , programming language
The Backside Absorbing Layer Microscopy (BALM) is a recently introduced surface imaging technique in reflected light with an unprecedented combination of sensitivity and lateral resolution, hence very promising for the development of imaging sensors. This requires to turn BALM images into quantative analyte measurements. The usual way to analyze reflectivity is to compare the optical signal and a numerical model with many adjustable parameters. Here we demonstrate a universal relationship between the sample reflectivity and the physical thickness of the sample, ruled by three measurable quantities. Mapping the physical sample thickness becomes possible whatever the instrument setting and the sample refractive index. Application to kinetic measurements is discussed.