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Greatly enhanced performance of AlGaN-based deep ultraviolet light emitting diodes by introducing a polarization modulated electron blocking layer
Author(s) -
Jing Lang,
Fujun Xu,
Weikun Ge,
B. Y. Liu,
N. Zhang,
Yan Sun,
J. M. Wang,
M. X. Wang,
Nan Xie,
Xin Fang,
Xiaoning Kang,
Zhixin Qin,
Xuelin Yang,
X. Q. Wang,
Bo Shen
Publication year - 2019
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.27.0a1458
Subject(s) - materials science , optoelectronics , diode , voltage droop , quantum efficiency , ultraviolet , light emitting diode , polarization (electrochemistry) , electron , optics , wavelength , leakage (economics) , power (physics) , physics , chemistry , quantum mechanics , economics , voltage divider , macroeconomics
Carrier transport in AlGaN-based deep ultraviolet (DUV) light emitting diodes (LEDs) with the wavelength of 273 nm has been investigated by introducing polarization modulated electron blocking layer (EBL) that adopts an Al composition and thickness graded multiple quantum barriers (MQB) structure. The experimental result shows that the maximum light output power and external quantum efficiency for the proposed structure at the current of 250 mA are 9.6 mW and 1.03% respectively, severally increasing by 405% and 249% compared to traditional one, meanwhile, the efficiency droop at 250 mA is also dramatically reduced from 42.2% to 16.6%. Further simulation analysis indicates that this graded MQB-EBL enhances the potential barrier height for electrons and meanwhile reduces that for holes, hence effectively suppresses the electron leakage, and at the same time significantly improves the hole injection efficiency. As a result, the whole performance of the LED with the proposed MQB-EBL is dramatically improved.