Open AccessSingle trace terahertz spectroscopic ellipsometry
Author(s) -
Miguel A. Báez-Chorro,
B. Vidal
Publication year - 2019
Publication title -
optics express
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.27.035468
Subject(s) - terahertz radiation , optics , ellipsometry , refractive index , birefringence , materials science , terahertz spectroscopy and technology , reflection (computer programming) , total internal reflection , spectrometer , optoelectronics , physics , thin film , computer science , programming language , nanotechnology
A new technique for terahertz time-domain ellipsometry is presented. Information of reflection coefficients of the sample in two orthogonal polarizations is encoded on the same terahertz trace by using a birefringent medium. This allows for single measurement refractive index extraction without the need for a moving analyzer. A comparison of the complex refractive index measurements of optical grade fused silica and non birefringent sapphire are carried out both in reflection ellipsometry and with a standard terahertz transmission spectrometer showing good agreement.