Open AccessSpeckle pattern shifting deflectometry based on digital image correlation
Author(s) -
Xinwei Zhang,
Dahai Li,
Ruiyang Wang,
Haichao Tang,
Peng Luo,
Kun Xu
Publication year - 2019
Publication title -
optics express
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.394
H-Index - 271
ISSN - 1094-4087
DOI - 10.1364/oe.27.025395
Subject(s) - speckle pattern , optics , displacement (psychology) , wafer , specular reflection , digital image correlation , speckle noise , computer science , materials science , physics , optoelectronics , psychology , psychotherapist
A method based on digital image correlation (DIC) for the surface shape measurement of specular surface by shifting a speckle pattern, which is displayed on an LCD screen, is proposed in this paper. With this method, the deformed information of test surface is encoded within the displacement distribution between the two recorded speckle images before and after the speckle pattern shifted. The displacement distribution is calculated by the DIC algorithm, then the slope data and the surface shape are obtained. The principle and algorithm of speckle pattern shifting deflectometry (SPSD) are described in detail. The correctness and feasibility of the proposed method are verified by simulation, and the source of error is analyzed as well. Finally, the shape of an acrylic plastic plate and a silicon wafer are measured. The experimental result of the proposed method is compared with that of PMD, and the figure error is around 1μm RMS with a measured diameter of about 100mm. This method has the advantages of fast measurement, simple device, low cost and needlessness of reference element. It provides a new approach to measure the shape of specular surface.